Characterization of thin film semiconductor devices
H-Index Rankings
University / Institution:
# 13
Country:
# 115
Region:
# 18,834
World:
# 783,710
H-Index
Total:
12
Last 6 Year:
8
Last 6 Year/Total:
0.667
i10 Index
Total:
17
Last 6 Year:
7
Last 6 Year/Total:
0.412
Citation
Total:
560
Last 6 Year:
206
Last 6 Year/Total:
0.368
H-Index Rankings
University / Institution:
# 80
Country:
# 779
Region:
# 86,510
World:
# 1,556,235
H-Index
Total:
1
Last 6 Year:
1
Last 6 Year/Total:
1.000
i10 Index
Total:
0
Last 6 Year:
0
Last 6 Year/Total:
0
Citation
Total:
3
Last 6 Year:
3
Last 6 Year/Total:
1.000
AD Scientific Index - World Scientists Rankings - 2024 | H INDEX | i10 INDEX | CITATION | |||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
University / Institution | Country | Region | World | Name | Country | University / Institution | Subject | Total | Last 6 year | Last 6 year/total | Total | Last 6 year | Last 6 year/total | Total | Last 6 year | Last 6 year/total |
13 | 115 | 18,834 | 783,710 |
|
Zimbabwe | Midlands State University |
Natural Sciences / Physics
Characterization of thin film semiconductor devices | |
12 | 8 | 0.667 | 17 | 7 | 0.412 | 560 | 206 | 0.368 |
80 | 779 | 86,510 | 1,556,235 |
|
Zimbabwe | Midlands State University |
Natural Sciences / Physics
general relativity | |
1 | 1 | 1.000 | 0 | 0 | 0 | 3 | 3 | 1.000 |