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Cheng-Wen Wu 吳誠文

Cheng-Wen Wu 吳誠文

National Tsing Hua University Taiwan - Hsinchu / Taiwan
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 294915
國立清華大學
person_outline Cheng-Wen Wu 吳誠文's MOST POPULAR ARTICLES
1-) VLSI test principles and architectures: design for testability Elsevier, 2006
2-) RRAM defect modeling and failure analysis based on march test and a novel squeeze-search scheme IEEE Transactions on Computers 64 (1), 180-190, 2014
3-) Built-in redundancy analysis for memory yield improvement IEEE transactions on Reliability 52 (4), 386-399, 2003
4-) On-chip TSV testing for 3D IC before bonding using sense amplification 2009 Asian Test Symposium, 450-455, 2009
5-) A programmable BIST core for embedded DRAM IEEE Design & Test of Computers 16 (1), 59-70, 1999