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Fan Yang

Fan Yang

Intel Corporation - California / United States
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 5323201
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person_outline Fan Yang's MOST POPULAR ARTICLES
1-) On the detectability of scan chain internal faults an industrial case study 26th IEEE VLSI Test Symposium (vts 2008), 79-84, 2008
2-) Detection of internal stuck-open faults in scan chains 2008 IEEE International Test Conference, 1-10, 2008
3-) Improving the detectability of resistive open faults in scan cells 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2009
4-) Silicon evaluation of cell-aware ATPG tests and small delay tests 2014 IEEE 23rd Asian Test Symposium, 101-106, 2014
5-) Silicon evaluation of faster than at-speed transition delay tests 2012 IEEE 30th VLSI Test Symposium (VTS), 80-85, 2012