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Guy Brammertz

Guy Brammertz

Interuniversity Microelectronics Centre - Leuven / Belgium
Engineering & Technology / Metallurgical & Materials Engineering
AD Scientific Index ID: 4983568
person_outline Guy Brammertz's MOST POPULAR ARTICLES
1-) On the correct extraction of interface trap density of MOS devices with high-mobility semiconductor substrates IEEE Transactions on Electron Devices 55 (2), 547-556, 2008
2-) Characterization of defects in 9.7% efficient Cu2ZnSnSe4-CdS-ZnO solar cells Applied Physics Letters 103 (16), 2013
3-) Characteristic trapping lifetime and capacitance-voltage measurements of GaAs metal-oxide-semiconductor structures Applied physics letters 91 (13), 2007
4-) Capacitance-voltage characterization of GaAs–Al2O3 interfaces Applied Physics Letters 93 (18), 2008
5-) Electrical study of sulfur passivated In0. 53Ga0. 47As MOS capacitor and transistor with ALD Al2O3 as gate insulator Microelectronic Engineering 86 (7-9), 1554-1557, 2009