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Jakob Michl

Jakob Michl

Technische Universität Wien - Vienna / Austria
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AD Scientific Index ID: 6110865
Technical University of Vienna
person_outline Jakob Michl's MOST POPULAR ARTICLES
1-) Reliability and variability of advanced CMOS devices at cryogenic temperatures 2020 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2020
2-) Toward automated defect extraction from bias temperature instability measurements IEEE Transactions on Electron Devices 68 (8), 4057-4063, 2021
3-) Comphy v3. 0—A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices Microelectronics Reliability 146, 115004, 2023
4-) Evidence of tunneling driven random telegraph noise in cryo-CMOS 2021 IEEE International Electron Devices Meeting (IEDM), 31.3. 1-31.3. 4, 2021
5-) Single-versus multi-step trap assisted tunneling currents—Part I: Theory IEEE Transactions on Electron Devices 69 (8), 4479-4485, 2022