AD Scientific Index
 Open Nav
Login Login Pricing & Plans Pricing & Plans
Michal Lesňák

Michal Lesňák

Technical University of Ostrava - Ostrava / Czech Republic
Others
AD Scientific Index ID: 1521994
VSB - Technical University of Ostrava
person_outline Michal Lesňák's MOST POPULAR ARTICLES
1-) Dispersive white-light spectral interferometry with absolute phase retrieval to measure thin film Optics express 14 (17), 7678-7685, 2006
2-) Physical properties of Al doped Ba hexagonal ferrite thin films Journal of Applied Physics 113 (4), 2013
3-) Thickness of SiO2 thin film on silicon wafer measured by dispersive white-light spectral interferometry Applied Physics B 84 (3), 511-516, 2006
4-) Mechanisms of water mist and their use in practice Journal of Loss Prevention in the Process Industries 95, 105590, 2025
5-) Efficiency of high gradient magnetic separation applied to micrometric magnetic particles Separation Science and Technology 50 (16), 2606-2615, 2015