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Mohamed Belhaj

Mohamed Belhaj

Office national d'études et de recherches aérospatiales - Palaiseau / France
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AD Scientific Index ID: 4424308
National Office for Aerospace Studies and Research
person_outline Mohamed Belhaj's MOST POPULAR ARTICLES
1-) Secondary electron emission on space materials: Evaluation of the total secondary electron yield from surface potential measurements IEEE Transactions on Plasma Science 40 (2), 282-290, 2011
2-) Analysis of two methods of measurement of surface potential of insulators in SEM: electron spectroscopy and X-ray spectroscopy methods Applied surface science 177 (1-2), 58-65, 2001
3-) Time-dependent measurement of the trapped charge in electron irradiated insulators: Application to –sapphire Journal of Applied Physics 88 (5), 2289-2294, 2000
4-) Radiation induced conductivity in space dielectric materials Journal of Applied Physics 115 (3), 2014
5-) Surface potential measurements of electron-irradiated insulators using backscattered and secondary electron spectra from an electrostatic toroidal spectrometer adapted for … Review of Scientific Instruments 72 (3), 1788-1795, 2001