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Namo Vijayakumar

Namo Vijayakumar

Auburn University - Auburn / United States
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 5313096
person_outline Namo Vijayakumar's MOST POPULAR ARTICLES
1-) The effect of iso-thermal aging on vibrational performance of SAC 105 and 305 alloys 2013 IEEE International Symposium on Advanced Packaging Materials, 69-81, 2013
2-) Drop Reliability test on different dimensional Lead-free Wafer level Chip Scale packages SMTA International, 2012
3-) The Effects of Thermal Aging on the Mechanical Behavior of Fine Pitch Electronics Packages Auburn University, 2013
4-) Impact of Component Termination on Conductive Adhesive Reliability for Harsh Environment ElectronicsJL Evans, F Xie, H Pai, N Vijayakumar, J Cobb, D Skamser, A Hill, S Harry