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Nikolaos Makris

Nikolaos Makris

Technical University of Crete - Crete / Greece
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AD Scientific Index ID: 4936307
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person_outline Nikolaos Makris's MOST POPULAR ARTICLES
1-) CMOS small-signal and thermal noise modeling at high frequencies IEEE Transactions on Electron Devices 60 (11), 3726-3733, 2013
2-) Total ionizing dose effects on analog performance of 65 nm bulk CMOS with enclosed-gate and standard layout 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS …, 2018
3-) Generalized constant current method for determining MOSFET threshold voltage IEEE Transactions on Electron Devices 67 (11), 4559-4562, 2020
4-) Charge-based model for junction FETs IEEE Transactions on Electron Devices 65 (7), 2694-2698, 2018
5-) Modeling of high total ionizing dose (TID) effects for enclosed layout transistors in 65 nm bulk CMOS 2018 International Semiconductor Conference (CAS), 133-136, 2018