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Philippe Ferrandis

Philippe Ferrandis

Université de Toulon - La Garde / France
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AD Scientific Index ID: 5432639
University of Toulon
person_outline Philippe Ferrandis's MOST POPULAR ARTICLES
1-) Investigation of sidewall damage induced by reactive ion etching on AlGaInP MESA for micro-LED application Journal of Luminescence 234, 117937, 2021
2-) Effects of negative bias stress on trapping properties of AlGaN/GaN Schottky barrier diodes Microelectronic Engineering 178, 158-163, 2017
3-) Deep-level transient spectroscopy of interfacial states in “buffer-free” pin GaSb/GaAs devices Journal of Applied Physics 114 (13), 2013
4-) Ion-assisted gate recess process induced damage in GaN channel of AlGaN/GaN Schottky barrier diodes studied by deep level transient spectroscopy Japanese Journal of Applied Physics 56 (4S), 04CG01, 2017
5-) Study of deep traps in AlGaN/GaN high-electron mobility transistors by electrical characterization and simulation Journal of Applied Physics 125 (3), 035702, 2019