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Po-Yuan Chen 陳柏源|Boyuan Chen

Po-Yuan Chen 陳柏源|Boyuan Chen

National Cheng Kung University - Tainan City / Taiwan
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AD Scientific Index ID: 404567
國立成功大學
person_outline Po-Yuan Chen 陳柏源|Boyuan Chen's MOST POPULAR ARTICLES
1-) On-chip TSV testing for 3D IC before bonding using sense amplification 2009 Asian Test Symposium, 450-455, 2009
2-) On-chip testing of blind and open-sleeve TSVs for 3D IC before bonding 2010 28th VLSI Test Symposium (VTS), 263-268, 2010
3-) Method for testing through-silicon-via and the circuit thereof US Patent 8,531,199, 2013
4-) A memory yield improvement scheme combining built-in self-repair and error correction codes 2012 IEEE International Test Conference, 1-9, 2012
5-) Method for testing through-silicon-via and the circuit thereof US Patent App. 12/572,030, 2011