AD Scientific Index
 Open Nav
Login Login Pricing & Plans Pricing & Plans
Rene Krenz Bååth

Rene Krenz Bååth

Hochschule Hamm-Lippstadt - Hamm / Germany
Others
AD Scientific Index ID: 1759473
Hamm-Lippstadt University of Applied Sciences
person_outline Rene Krenz Bååth's MOST POPULAR ARTICLES
1-) Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs 2009 International Test Conference, 1-10, 2009
2-) Defect-oriented cell-internal testing 2010 IEEE International Test Conference, 1-10, 2010
3-) A suite of IEEE 1687 benchmark networks 2016 IEEE International Test Conference (ITC), 1-10, 2016
4-) A new SAT-based ATPG for generating highly compacted test sets 2012 IEEE 15th International Symposium on Design and Diagnostics of …, 2012
5-) On optimization-based ATPG and its application for highly compacted test sets IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2016