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Soonyoung Cha

Soonyoung Cha

NASA Johnson Space Center - Houston / United States
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 5192445
person_outline Soonyoung Cha's MOST POPULAR ARTICLES
1-) System-level modeling of microprocessor reliability degradation due to BTI and HCI 2014 IEEE International Reliability Physics Symposium, CA. 8.1-CA. 8.9, 2014
2-) System-level variation-aware aging simulator using a unified novel gate-delay model for bias temperature instability, hot carrier injection, and gate oxide breakdown Microelectronics Reliability 55 (9-10), 1334-1340, 2015
3-) Extraction of threshold voltage degradation modeling due to negative bias temperature instability in circuits with I/O measurements 2014 IEEE 32nd VLSI Test Symposium (VTS), 1-6, 2014
4-) Processor-level reliability simulator for time-dependent gate dielectric breakdown Microprocessors and Microsystems 39 (8), 950-960, 2015
5-) AVERT: An elaborate model for simulating variable retention time in DRAMs Microelectronics Reliability 55 (9-10), 1313-1319, 2015