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Suhyun Kim

Suhyun Kim

Institute of Science Tokyo - Tokyo / Japan
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 4502046
東京工業大学
person_outline Suhyun Kim's MOST POPULAR ARTICLES
1-) Scanning moiré fringe imaging for quantitative strain mapping in semiconductor devices Applied Physics Letters 102 (16), 2013
2-) Quantitative measurement of strain field in strained-channel-transistor arrays by scanning moiré fringe imaging Applied Physics Letters 103 (3), 2013
3-) Quantitative annular dark-field STEM images of a silicon crystal using a large-angle convergent electron probe with a 300-kV cold field-emission gun Journal of electron microscopy 60 (2), 109-116, 2011
4-) Electron microscopy at a sub-50 pm resolution Journal of electron microscopy 60 (suppl_1), S239-S244, 2011
5-) Strained hetero interfaces in Si/SiGe/SiGe/SiGe multi-layers studied by scanning moiré fringe imaging Journal of Applied Physics 114 (5), 2013