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Vincent Goiffon

Vincent Goiffon

Institut Supérieur de l'Aéronautique et de l'Espace ISAE SUPAERO - Toulouse / France
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AD Scientific Index ID: 918788
Higher Institute of Aeronautics and Space
person_outline Vincent Goiffon's MOST POPULAR ARTICLES
1-) Radiation effects in pinned photodiode CMOS image sensors: Pixel performance degradation due to total ionizing dose IEEE Transactions on Nuclear Science 59 (6), 2878-2887, 2012
2-) Displacement damage effects due to neutron and proton irradiations on CMOS image sensors manufactured in deep submicron technology IEEE Transactions on Nuclear Science 57 (6), 3101-3108, 2010
3-) Multilevel RTS in proton irradiated CMOS image sensors manufactured in a deep submicron technology IEEE transactions on nuclear science 56 (4), 2132-2141, 2009
4-) Enhanced Radiation-Induced Narrow Channel Effects in Commercialm Bulk Technology IEEE Transactions on Nuclear Science 58 (6), 2807-2815, 2011
5-) Total ionizing dose versus displacement damage dose induced dark current random telegraph signals in CMOS image sensors IEEE Transactions on Nuclear Science 58 (6), 3085-3094, 2011